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KMID : 0385520130260050340
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Analytical Science & Technology
2013 Volume.26 No. 5 p.340 ~ p.351
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The analytical application for cement using X-Ray diffraction and X-Ray fluorescence spectrometer
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Jung Ji-Eun
Kim Ki-Wook
Heo Sang-Cheol
Min Ji-Sook
Jang Yu-Rim
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Abstract
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The chemical element and structural characterization of different types of cements and its brick stones are been investigated under forensic aspects using X-ray florescence (XRF) and X-ray diffraction (XRD) spectrometer. The XRF provides rapid compositional data for controlling almost all stages of raw materials, clinker and cement. The decisive advantage of XRD methods is based on the unique character of the diffraction patterns of crystalline substances, the ability to distinguish between elements and their oxides, and the possibility to identify chemical compounds, polymeric forms, and mixed crystals by non-destructive examination. Therefore, combination of these examinations is useful and able to apply for the forensic analysis in comparison of cements and brick stones. There are more study remained to determine the viability of method for forensic analysis of brick stones and the limits of the discrimination that can be achieved.
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KEYWORD
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XRF, XRD, PCA, Cements, Bricks,
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